An Introduction to Mixed-Signal Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns

By Gordon Roberts, Friedrich Taenzler, Mark Burns

Built-in circuits incorporating either electronic and analog capabilities became more and more familiar within the semiconductor undefined. Mixed-signal IC try out and dimension has grown right into a hugely really good box of electric engineering. although, try out engineering remains to be a comparatively unknown career in comparison to IC layout engineering.

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Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman,Digital SystemsTestingand Testable Design, Revised Printing, IEEE Press, New York, NY, January, 1998, ISBN:0780310624 3. ParagK. Lala, Practical Digital Logic Design and Testing,PrenticeHall, Upper Saddle River,New Jersey,1996,ISBN: 0023671718 4. J. , New York, NY 10158-0012,1987,ISBN: 0471851353 5. David A. 1 Purpose of a Data Sheet Beginning test engineers often spend a great deal of time learning how to generatetest plans for mixed-signal devices.

A 100-Hz sine wave takes 10 ms per cycle no matter how small we shrink a transistor. The only hope of salvation from photolithography is the addition of test features into the design itself that aid in the testing of the DUT. Mainframe ATE equipment is designed to minimize test time and maximize overall product throughput. 21). The purpose of the second head is to allow the tester to simultaneously test a device on one head while a second handler or prober is moving and sorting devices on the other head.

The PIB is a specialized type of DIB board that may be connectedto the probe card through coaxial cables and/or spring-loaded contacts called pogo pins. The PIB and probe card serve the samepurpose for the wafer that the DIB board servesfor the packageddevice. They provide a means of temporarily connecting the DUT to the ATE tester'selectrical instrumentation while testing is performed. The prober informs the tester when it has placed each new die against the probes of the probe card. The ATE tester then executes a series of electrical tests on the die before instructing the proberto move to the next die.

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